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Adhesion of thin films of epitaxial oxides to nickel-based metallic substrates is important for the successful development of high-temperature superconductor coated conductors. Detachment of epitaxial oxide buffer layers at the oxide/metal interface during either oxide growth or subsequent processing renders the conductor useless. In this study, thermal desorption spectroscopy (TDS) has been used to identify and understand one of the causes of buffer layer detachment, oxidation of carbon at the oxide–metal interface to form carbon monoxide. Results of TDS indicate that on the surface of a bare nickel-based alloy substrate, the rate of carbon oxidation depends on both the supply of carbon from the substrate and the supply of oxygen from the vapor. Sulfur at the surface of the alloy substrate reduces the rate of carbon oxidation. The effectiveness of various treatments of the bare substrate to eliminate CO formation and epitaxial oxide detachment has been demonstrated. TDS provides both a means to evaluate the kinetics of the oxidation reaction and a tool to assess the need and effectiveness of a substrate oxidation treatment.
The effects of conversion parameters on transport properties of YBa2Cu3O7-δ (YBCO) films on rolling assisted biaxially textured substrates (RABiTS) in the BaF2 ex situ process were investigated for total pressures Ptotal between 0.1 and 1.3 atm, water vapor pressures PH2O between approximately 7 and 70 Torr and processing temperatures TS between 700 and 790 °C. For this study, a 0.3-μm-thick Y–BaF2–Cu–O precursor film was deposited on a 1-cm-wide Ni=3 at.% W RABiTS with a buffer layer architecture of CeO2/YSZ/Y2O3/Ni deposited in single passes in various reel-to-reel systems for each layer. Under the conditions of Ptotal = 0.1 atm, TS = 740 °C and PO2 approximately 150 mTorr, JC > 2 MA/cm2 was obtained at 77 K and self field for PH2O ≤ 20 Torr. At higher PH2O (=70 Torr), however, the maximum attainable JC decreased. In addition, the JC at these higher PH2O dropped rapidly with increased dwell time. The highest JC, 2.5 MA/cm2, was achieved at 730 °C with Ptotal = 0.1 atm and PH2O approximately 7 Torr. Finally, the variation of IC with wet conversion time was performed at each processing temperature.
Using in situ reflection high energy electron diffraction and x-ray diffraction, the structure and composition of nickel and titanium multilayer films have been studied. The films were evaporated under UHV conditions at rates of.01 to.1 nm/sec. When deposited on an amorphous NiTi film at 70°C, the individual layers of nickel or titanium are polycrystalline and textured with the close-packed planes perpendicular to the growth direction. The interface between the layers is amorphous and about 2 nm thick. X-ray scattering from the crystalline layers indirectly shows the composition of the amorphous interface to be Ni rich.
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