19 results
Atomic-Scale Analysis of Strain Relaxation Mechanisms in Ultra-Thin Metallic Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 880 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, BB2.2/O3.2
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- 2005
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Analysis of Electromigration- and Stress-Induced Dynamical Response of Voids Confined in Metallic Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 899 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0899-N07-17
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- 2005
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Analysis of Electromigration-Induced Void Motion and Surface Oscillations in Metallic Thin-Film Interconnects
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- MRS Online Proceedings Library Archive / Volume 863 / 2005
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- 01 February 2011, B9.8
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- 2005
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Strain Relaxation in Si1-xGex Thin Films on Si (100) Substrates: Modeling and Comparisons with Experiments
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- MRS Online Proceedings Library Archive / Volume 875 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, O4.21
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- 2005
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The Role of SiH3 Diffusion in Determining the Surface Smoothness of Plasma-Deposited Amorphous Si Thin Films: An Atomic-Scale Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 862 / 2005
- Published online by Cambridge University Press:
- 01 February 2011, A3.2
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- 2005
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Surface Processes during Growth of Hydrogenated Amorphous Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 808 / 2004
- Published online by Cambridge University Press:
- 21 March 2011, A5.5
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- 2004
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In Situ Probing and Atomistic Simulation of a-Si:H Plasma Deposition
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- MRS Online Proceedings Library Archive / Volume 664 / 2001
- Published online by Cambridge University Press:
- 17 March 2011, A1.1
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- 2001
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Atomic-Scale Analysis of Plasma-Enhanced Chemical Vapor Deposition from SiH4/2 Plasmas on Si Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 507 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 673
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- 1998
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Interfacial Stability and Surface Morphology in Layer-By-Layer Semiconductor Heteroepitaxy Luis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 528 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 153
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- 1998
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Theoretical Analysis of Faceted Void Dynamics in Metallic Thin Films Under Electromigration Conditions
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- MRS Online Proceedings Library Archive / Volume 529 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 21
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- 1998
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Analysis of Failure in Metallic Thin-Film Interconnects Due to Stress and Electromigration-Induced Void Propagation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 165
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- January 1998
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Interfacial Stability and Misfit Dislocation Formation in InAs/Gaas(110) Heteroepitaxy
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- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 191
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- 1997
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Theoretical Analysis of Electromigration-Induced Failure of Metallic Thin Films
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- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 249
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- 1997
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Atomic-Scale Analysis of the Reactivity of Radicals from Silane/Hydrogen Plasmas with Silicon Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 485 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 107
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- 1997
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Theory and Computer Simulation of Grain-Boundary and Void Dynamics in Polycrystalline Conductors
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- MRS Online Proceedings Library Archive / Volume 391 / 1995
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- 15 February 2011, 151
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- 1995
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Diffusive Creep in Polycrystals
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- Journal:
- MRS Online Proceedings Library Archive / Volume 317 / 1993
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- 15 February 2011, 449
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- 1993
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Atomistic Simulations of Point Defect Properties in Silicon
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- MRS Online Proceedings Library Archive / Volume 278 / 1992
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- 26 February 2011, 115
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- 1992
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Analysis of Oxygen Gettering and Dislocation Locking in Silicon
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- MRS Online Proceedings Library Archive / Volume 209 / 1990
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- 26 February 2011, 597
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- 1990
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Diffusion of Point Defects in a Stressed Simple Cubic Lattice
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- MRS Online Proceedings Library Archive / Volume 163 / 1989
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- 25 February 2011, 615
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- 1989
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