4 results
Sample Orientation for Electron Channeling Contrast Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 508-509
- Print publication:
- August 2019
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In-situ Low Energy Argon Ion Source for Artifact Free High Resolution STEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 548-549
- Print publication:
- August 2019
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In-situ Low Energy Argon Ion Source for the Improvement of EBSD Pattern Acquisition
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1060-1061
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- August 2018
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Applications of an in-situ Low Energy Argon Ion Source for Improvement of TEM and SEM Sample Quality
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 298-299
- Print publication:
- July 2017
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