17 results
Live Processing of Momentum-Resolved STEM Data for First Moment Imaging and Ptychography
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 5 / October 2021
- Published online by Cambridge University Press:
- 05 August 2021, pp. 1078-1092
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- October 2021
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Quantitative characterization of nanometer-scale electric fields via momentum-resolved STEM
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- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2206-2207
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- August 2021
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Quantitative 3D Characterization of Nanoporous Gold Nanoparticles by Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 04 June 2021, pp. 678-686
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- August 2021
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Quantitative Simulation of Four-dimensional STEM Datasets
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- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
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- 30 July 2020, pp. 250-251
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- August 2020
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Quantitative STEM: Comparative Studies of Composition and Optical Properties of Semiconductor Quantum Structures
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 1690-1691
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- July 2017
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Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
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- 25 July 2016, pp. 484-485
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- July 2016
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Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 890-891
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- July 2016
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Simultaneous Quantification of Indium and Nitrogen Concentration in InGaNAs Using HAADF-STEM
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- Microscopy and Microanalysis / Volume 20 / Issue 6 / December 2014
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- 30 September 2014, pp. 1740-1752
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- December 2014
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A Nanocrystalline Hilbert Phase-Plate for Phase-Contrast Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
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- 27 August 2014, pp. 236-237
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- August 2014
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Influence of Static Atomic Displacements on Composition Quantification of AlGaN/GaN Heterostructures from HAADF-STEM Images
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- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 10 July 2014, pp. 1463-1470
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- October 2014
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Quantitative Strain and Compositional Studies of InxGa1−xAs Epilayer in a GaAs-based pHEMT Device Structure by TEM Techniques
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- Microscopy and Microanalysis / Volume 20 / Issue 4 / August 2014
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- 23 April 2014, pp. 1262-1270
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- August 2014
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Investigation of a Nanoporous Gold / TiO2 Catalyst by Electron Microscopy and Tomography
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- MRS Online Proceedings Library Archive / Volume 1504 / 2013
- Published online by Cambridge University Press:
- 22 February 2013, mrsf12-1504-v08-07
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- 2013
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Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue 5 / October 2012
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- 02 October 2012, pp. 995-1009
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- October 2012
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Photoconductivity of ZnO Nanowires Decorated with CdSe Quantum Dots
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- MRS Online Proceedings Library Archive / Volume 1408 / 2012
- Published online by Cambridge University Press:
- 11 January 2012, mrsf11-1408-bb10-20
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- 2012
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Segregation in InGaAs/GaAs Quantum Wells: MOCVD versus MBE
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
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- 05 September 2003, pp. 230-231
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- September 2003
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Structure factors for the composition determination of InGaAs/GaAs quantum wells with the 002 beam: Isolated atom approximation versus density functional theory
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- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
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- 05 September 2003, pp. 234-235
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- September 2003
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MOCVD Growth of Ga(Al)N/InGaN/Ga(Al)N-Heterostructures: Influence of the Buffer Layer Al-Concentration and Growth Duration on the In-Incorporation in InGaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E3.6
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- 2001
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