36 results
Advances in STEM and EELS: New Operation Modes, Detectors and Software
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
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- 05 August 2019, pp. 512-513
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- August 2019
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Improving the STEM Spatial Resolution Limit
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
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- 01 August 2018, pp. 18-19
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- August 2018
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Ultra-High Energy Resolution EELS
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 1552-1553
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- July 2017
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First Nucleotide Sequence Data from an Electron Microscopy Based DNA Sequencer
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 208-209
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- August 2013
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Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 976-977
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- July 2012
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DNA Sequencing by Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1274-1275
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- July 2011
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Nanoanalysis in SEM and STEM: EDS Using Silicon Drift Detectors in Comparison to EELS Using Cs-Corrected STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 936-937
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- July 2010
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Scanning Transmission Electron Microscopy: The Major Beneficiary of Aberration Correction?
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 152-153
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- July 2009
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Element Distribution in Novel Hedgehog-Like Magnetic Nanostructures Studied by, Cs-Corrected STEM-EELS and Uncorrected STEM-XEDS Using SDD-Technology
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1214-1215
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- July 2009
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XEDS with SDD-Technology in Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 202-203
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- July 2009
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3-D Scanning Transmission Electron Microscopy of Carbide-Derived Carbons for Electrical Energy Storage
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 632-633
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- July 2009
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Atomic-resolution Studies of Ca3Co4O9 using in-situ Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 436-437
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- August 2008
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Is there still a place for aberration corrected user facilities?
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1408-1409
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- August 2008
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Performance of a Nion Co. UltraSTEMTM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1376-1377
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- August 2008
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Three-Dimensional Reconstruction of Au Nanoparticles Using Five Projections from an Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1048-1049
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- August 2008
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Axiotaxy of CrSi2 on Si(001); from the Micrometer- to the Angstrom-Scale
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
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- 07 September 2007, pp. 396-397
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- September 2007
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The Interface of Epitaxial Cubic Silicide Films with Modified Lattice Parameter on Si(001) Investigated by Aberration Corrected Dedicated STEM
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- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 394-395
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- September 2007
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Aberration Corrected Scanning TEM Applied to Biological Specimens
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 132-133
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- August 2007
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Applications of Atomic Scale Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 134-135
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- August 2006
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Advanced Tuning Algorithm for Crystalline Materials in Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1342-1343
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- August 2006
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