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Is there still a place for aberration corrected user facilities?

Published online by Cambridge University Press:  03 August 2008

MH Gass ,
P Wang ,
K Sader ,
B Mendis ,
I Godfrey  and
A Bleloch
MH Gass
Affiliation:
SuperSTEM, United Kingdom
P Wang
Affiliation:
SuperSTEM, United Kingdom
K Sader
Affiliation:
SuperSTEM, United Kingdom
B Mendis
Affiliation:
SuperSTEM, United Kingdom
I Godfrey
Affiliation:
SuperSTEM, United Kingdom
A Bleloch
Affiliation:
SuperSTEM, United Kingdom
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1408 - 1409
Copyright
© 2008 Microscopy Society of America

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