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Microscale Elemental Imaging of Semiconductor Materials Using Focused Ion Beam Sims
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- Journal:
- Microscopy and Microanalysis / Volume 4 / Issue S2 / July 1998
- Published online by Cambridge University Press:
- 02 July 2020, pp. 650-651
- Print publication:
- July 1998
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Processing of submicron grain 304 stainless steel
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- Journal:
- Journal of Materials Research / Volume 11 / Issue 11 / November 1996
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2677-2680
- Print publication:
- November 1996
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Nitride-Based Thin-Film Cold Cathode Emitters
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- Journal:
- MRS Online Proceedings Library Archive / Volume 449 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 1121
- Print publication:
- 1996
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