11 results
Optimization of amorphous semiconductors and low-/high-k dielectrics through percolation and topological constraint theory
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- Journal:
- MRS Bulletin / Volume 42 / Issue 1 / January 2017
- Published online by Cambridge University Press:
- 10 January 2017, pp. 39-44
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- January 2017
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Atomic Layer Deposited Hybrid Organic-Inorganic Aluminates as Potential Low-k Dielectric Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1791 / 2015
- Published online by Cambridge University Press:
- 25 May 2015, pp. 15-20
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- 2015
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Detection of surface electronic defect states in low and high-k dielectrics using reflection electron energy loss spectroscopy
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- Journal:
- Journal of Materials Research / Volume 28 / Issue 20 / 28 October 2013
- Published online by Cambridge University Press:
- 15 October 2013, pp. 2771-2784
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- 28 October 2013
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Valence Band Offset at Amorphous Boron Carbide / Silicon Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1576 / 2013
- Published online by Cambridge University Press:
- 23 September 2013, mrss13-1576-ww04-08
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- 2013
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Transmission Fourier Transform Infra-red Spectroscopy Investigation of Structure Property Relationships in Low-k SiOxCy:H Dielectric Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1520 / 2013
- Published online by Cambridge University Press:
- 03 January 2013, mrsf12-1520-nn11-04
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- 2013
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Contributors
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- Book:
- The Cambridge Dictionary of Christianity
- Published online:
- 05 August 2012
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- 20 September 2010, pp xi-xliv
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Contributors
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- Book:
- The Cambridge Handbook of Forensic Psychology
- Published online:
- 06 July 2010
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- 29 April 2010, pp xix-xxiii
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Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy
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- Journal:
- Journal of Materials Research / Volume 24 / Issue 9 / September 2009
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2960-2964
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- September 2009
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Ex Situ and In Situ Methods for Complete Oxygen and Non-Carbidic Carbon Removal from (0001)SI 6H-SiC Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 423 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 563
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- 1996
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XPS Measurement of the SiC/AlN Band-Offset at the (0001) Interface
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- Journal:
- MRS Online Proceedings Library Archive / Volume 395 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 375
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- 1995
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Ex Situ and in Situ Methods for Oxide and Carbon Removal from AlN and GaN Surfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 395 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 739
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- 1995
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