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In Situ Observations of Pre-Patterned Void Interactions Under Electromigration-Induced Stress
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 101
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- 1996
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Duty Cycle and Frequency Effects of Pulsed-DC Currents on Electromigration-Induced Stress in Al Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 109
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- 1996
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Grain Structure and Electromigration Testing of Deep Sub- Micrometer Cu Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 403
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- 1995
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In-Situ Observations of Electromigration-Induced Void Dynamics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 404 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 163
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- 1995
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Nondestructive Measurement of Interphase Processes Using Impedance Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 203 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 189
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- 1990
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