7 results
Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 526-527
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- July 2010
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Sub-angstrom Spatial Resolution in Secondary-electron Imaging Achieved with an Aberration Corrected Scanning Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 610-611
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- July 2010
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Local Thickness Measurement in TEM
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 344-345
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- July 2010
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Electron Irradiation Damage of MgO Nanocube
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1794-1795
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- July 2010
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Mechanisms of Radiation Damage and Electron-Beam Fabrication
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1658-1659
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- July 2010
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Physics of Atomic-Scale Secondary-Electron Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 620-621
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- July 2010
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An ELNES Study of SiO2 Nanowires Grown from a Patterned Reagent
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1172-1173
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- August 2006
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