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XUV spectroscopic characterization of warm dense aluminum plasmas generated by the free-electron-laser FLASH
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- Journal:
- Laser and Particle Beams / Volume 30 / Issue 1 / March 2012
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- 30 March 2012, pp. 45-56
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Experimental Study of Etched Back Thermal Oxide for Optimization of the Si/High-k Interface
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- MRS Online Proceedings Library Archive / Volume 811 / 2004
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- 17 March 2011, E1.4
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- 2004
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Plasma-based studies with intense X-ray and particle beam sources
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- Laser and Particle Beams / Volume 20 / Issue 3 / July 2002
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- 12 February 2003, pp. 527-536
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Undercooling And X-Ray Structural Studies Of Ti-Zr-Ni Liquids
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- MRS Online Proceedings Library Archive / Volume 754 / 2002
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- 11 February 2011, CC10.5
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- 2002
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Contact Resistance of InGaN/GaN Light Emitting Diodes Grown on the Production Model Multi-Wafer MOVPE Reactor
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- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 703-708
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- 1999
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Kinetics of Light-Induced Changes in P-I-N Cells with Protocrystalline Si:H
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- MRS Online Proceedings Library Archive / Volume 557 / 1999
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- 15 February 2011, 263
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- 1999
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Contact Resistance of InGaN/GaN Light Emitting Diodes Grown on the Production Model Multi-Wafer Movpe Reactor
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- MRS Online Proceedings Library Archive / Volume 537 / 1998
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- 15 February 2011, G6.42
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- 1998
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Impedance spectroscopy of grain boundaries in nanophase ZnO
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- Journal of Materials Research / Volume 10 / Issue 9 / September 1995
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- 03 March 2011, pp. 2295-2300
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- September 1995
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Surface Analysis Of Lcd Materials iN Various Stages of Production by Time-of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS)
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- MRS Online Proceedings Library Archive / Volume 345 / 1994
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- 15 February 2011, 197
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- 1994
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Process-Property Relationships For a-Si1-xCx:H Deposition: Excursions in Parameter Space Guided by Real Time Spectroellipsometry
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- MRS Online Proceedings Library Archive / Volume 336 / 1994
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- 16 February 2011, 595
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- 1994
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