6 results
Towards Enhancing the Throughput and Eliminating the 4 Dimensions of Stitching Errors in Large Area, High Resolution SEM for Integrated Circuit Reverse Engineering and Connectomics
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 588-589
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- July 2016
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Generating Large Magnetic Field in a High Resolution Electron Beam Lithography
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1049-1050
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- August 2015
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Advanced Ion Source Technology for High Resolution and Stable FIB Nanofabrication employing Gallium and new Ion Species
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 312-313
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- August 2014
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Tailoring nanopores for efficient sensing of different biomolecules
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1253 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1253-K10-33
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- 2010
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Challenges and Opportunities for Focused Ion Beam Processing at the Nano-Scale
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- Journal:
- Microscopy Today / Volume 17 / Issue 5 / September 2009
- Published online by Cambridge University Press:
- 15 September 2009, pp. 14-17
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- September 2009
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Challenges and Opportunities for Focused Ion Beam Processing at the Nano-scale
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 320-321
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- July 2009
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