5 results
Challenges and New Approaches for Quantitative X-Ray Analysis in SEM at Low Beam Voltages
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1246-1247
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Achieving Accurate Estimates of Material Composition from Spectrum Images
-
- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1292-1293
- Print publication:
- August 2013
-
- Article
-
- You have access
- Export citation
Strategies for x-ray analysis of non-conductive specimens in a conventional scanning electron microscope
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 21 July 2003, pp. 522-523
- Print publication:
- August 2003
-
- Article
-
- You have access
- Export citation
Quantitative Microanalysis at Low kV : Precautions and Validation
-
- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1466-1467
- Print publication:
- August 2002
-
- Article
-
- You have access
- Export citation
Prospects for X-Ray Analysis of Rough Surfaces in the SEM
-
- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 918-919
- Print publication:
- August 2000
-
- Article
- Export citation