Strategies for x-ray analysis of non-conductive specimens in a conventional scanning electron microscope

P.J. Statham

doi:10.1017/S143192760344261X

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Strategies for x-ray analysis of non-conductive specimens in a conventional scanning electron microscope

Published online by Cambridge University Press: 21 July 2003

P.J. Statham

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P.J. Statham*: Affiliation:
Oxford Instruments Analytical Limited, High Wycombe, Bucks HP12 3SE, U.K

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 522 - 523

DOI: https://doi.org/10.1017/S143192760344261X [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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Strategies for x-ray analysis of non-conductive specimens in a conventional scanning electron microscope

Volume 9, Issue S02
P.J. Statham ^(a1)
DOI: https://doi.org/10.1017/S143192760344261X

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Strategies for x-ray analysis of non-conductive specimens in a conventional scanning electron microscope

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