Quantitative Microanalysis at Low kV : Precautions and Validation

P.J. Statham

doi:10.1017/S1431927602103965

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Quantitative Microanalysis at Low kV : Precautions and Validation

Published online by Cambridge University Press: 01 August 2002

P.J. Statham

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P.J. Statham*: Affiliation:
Oxford Instruments Analytical Limited, High Wycombe, Bucks HP12 3SE, U.K.

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1466 - 1467

DOI: https://doi.org/10.1017/S1431927602103965 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2002

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Quantitative Microanalysis at Low kV : Precautions and Validation

Volume 8, Issue S02
P.J. Statham ^(a1)
DOI: https://doi.org/10.1017/S1431927602103965

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Quantitative Microanalysis at Low kV : Precautions and Validation

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