3 results
Ellipsometric investigation of porous silicon layers for the design of a DBR
-
- Journal:
- The European Physical Journal - Applied Physics / Volume 43 / Issue 1 / July 2008
- Published online by Cambridge University Press:
- 19 June 2008, pp. 87-91
- Print publication:
- July 2008
-
- Article
- Export citation
Strain effects of InP/Si and InP/porous Si studied by spectroscopic ellipsometry
-
- Journal:
- The European Physical Journal - Applied Physics / Volume 42 / Issue 2 / May 2008
- Published online by Cambridge University Press:
- 28 March 2008, pp. 99-102
- Print publication:
- May 2008
-
- Article
- Export citation
Redistribution of nitrogen localized states in GaAsN layer doped Silicon
-
- Journal:
- The European Physical Journal - Applied Physics / Volume 38 / Issue 3 / June 2007
- Published online by Cambridge University Press:
- 13 June 2007, pp. 221-225
- Print publication:
- June 2007
-
- Article
- Export citation