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A Standards-Based Method to Determine Elemental Compositions using Energy Dispersive X-Ray Spectrometry for Compound Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1046-1047
- Print publication:
- July 2012
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Electrical and Structural Characterization of the Interface of Wafer Bonded InP/Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 763 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, B2.8
- Print publication:
- 2003
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Electrical and Structural Characterization of the Interface of Wafer Bonded InP/Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 768 / 2003
- Published online by Cambridge University Press:
- 02 August 2011, G2.4
- Print publication:
- 2003
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Carrier Transport in Ordered and Disordered In0.53Ga0.47As
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- Journal:
- MRS Online Proceedings Library Archive / Volume 441 / 1996
- Published online by Cambridge University Press:
- 10 February 2011, 181
- Print publication:
- 1996
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Room Temperature Measurement of Photoluminescence Spectra of Semiconductors Using an Ft-Raman Spectrophotometer
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- Journal:
- MRS Online Proceedings Library Archive / Volume 324 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 233
- Print publication:
- 1993
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