2 results
S22 Invited—Diffraction Analysis of Stress Gradients in Tin Thin Films: An Explanation for the Occurrence of Whisker Formation?
-
- Journal:
- Powder Diffraction / Volume 23 / Issue 2 / June 2008
- Published online by Cambridge University Press:
- 20 May 2016, p. 185
-
- Article
- Export citation
Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates
-
- Journal:
- Journal of Materials Research / Volume 25 / Issue 11 / November 2010
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2166-2174
- Print publication:
- November 2010
-
- Article
- Export citation