7 results
Interactions of Point Defects and Impurities With Open Volume Defects in Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 647 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, O2.4
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- 2000
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Characterization of Low-Temperature PECVD Silicon Dioxide Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 555 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 197
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- 1998
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Oxide and Nitride Formation and Segregation of Metals During Oxygen and Nitrogen Bombardment of Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 504 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 153
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- 1997
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The Influence of Cavities and Point Defects on Cu Gettering and B'Diffusion in Si
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- Journal:
- MRS Online Proceedings Library Archive / Volume 469 / 1997
- Published online by Cambridge University Press:
- 15 February 2011, 457
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- 1997
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Radiation-Induced Segregation of Metals At Moving SiO2-Amorphous Si Interfaces
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- Journal:
- MRS Online Proceedings Library Archive / Volume 439 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 575
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- 1996
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Microstructure of Irradiated Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 373 / 1994
- Published online by Cambridge University Press:
- 16 February 2011, 543
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- 1994
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The influence of implanted impurities on the thermally-induced epitaxial recrystallization of CoSi2
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- Journal:
- Journal of Materials Research / Volume 6 / Issue 5 / May 1991
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1035-1039
- Print publication:
- May 1991
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