6 results
Statistics of deformation twinning in Cu/Nb nanolamellar composites measured using electron backscatter diffraction (EBSD)
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 748-749
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- August 2013
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Crystallographic Origin of the Alternate Bright/Dark Contrast in 6H-SiC and other Hexagonal Crystal HREM Images
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- Microscopy and Microanalysis / Volume 2 / Issue 2 / April 1996
- Published online by Cambridge University Press:
- 31 July 2003, pp. 63-78
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- April 1996
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Chemistry, microstructure, and electrical properties at interfaces between thin films of platinum and alpha (6H) silicon carbide (0001)
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- Journal of Materials Research / Volume 10 / Issue 9 / September 1995
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2336-2342
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- September 1995
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Chemistry, microstructure, and electrical properties at interfaces between thin films of titanium and alpha (6H) silicon carbide (0001)
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- Journal of Materials Research / Volume 10 / Issue 3 / March 1995
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- 03 March 2011, pp. 668-679
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- March 1995
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Chemistry, microstructure, and electrical properties at interfaces between thin films of cobalt and alpha (6H) silicon carbide (0001)
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- Journal of Materials Research / Volume 10 / Issue 1 / January 1995
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- 03 March 2011, pp. 26-33
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- January 1995
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Chemical Widths at Composite Interfaces: Relationships to Structural Widths and Methods for Measurement
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- MRS Online Proceedings Library Archive / Volume 357 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 271
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- 1994
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