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Statistics of deformation twinning in Cu/Nb nanolamellar composites measured using electron backscatter diffraction (EBSD)

Published online by Cambridge University Press:  09 October 2013

R.J. McCabe ,
J.S. Carpenter ,
N.A. Mara  and
I.J. Beyerlein
R.J. McCabe
Affiliation:
J.S. Carpenter
Affiliation:
N.A. Mara
Affiliation:
I.J. Beyerlein
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 748 - 749
Copyright
Copyright © Microscopy Society of America 2013