5 results
Variation of Local Mechanical Stress During the Different Processing Steps of Ic-Isolation: a Micro-Raman Spectroscopy Study
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- Journal:
- MRS Online Proceedings Library Archive / Volume 308 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 355
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- 1993
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The Influence of Mechanical Stress on Hot-Carrier Degradation in Mosfet's
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- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 281
- Print publication:
- 1993
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The Influence of Mechanical Stress on Hot-Carrier Degradation in Mosfet'S
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- Journal:
- MRS Online Proceedings Library Archive / Volume 308 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 349
- Print publication:
- 1993
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Non-Destructive Assessment of Thin Film Stresses and Crystal Qualify of Silicon on Insulator Materials with Raman Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 188 / 1990
- Published online by Cambridge University Press:
- 16 February 2011, 53
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- 1990
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Qualitative Model for Surface Rippling of Zone Melting Recrystallized Silicon-on-Insulator Layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 157 / 1989
- Published online by Cambridge University Press:
- 25 February 2011, 461
- Print publication:
- 1989
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