8 results
Treating Knock-On Displacements in Fluctuation Electron Microscopy Experiments
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 6 / December 2022
- Published online by Cambridge University Press:
- 01 September 2022, pp. 2036-2046
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- December 2022
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Focused Ion Beam Sample Preparation for In Situ Thermal and Electrical Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue 4 / August 2021
- Published online by Cambridge University Press:
- 16 July 2021, pp. 828-834
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- August 2021
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Comparison of Experimental STEM Conditions for Fluctuation Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue 6 / December 2020
- Published online by Cambridge University Press:
- 27 August 2020, pp. 1100-1109
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- December 2020
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Simultaneous Phosphorus and Si Self-Diffusion in Extrinsic, Isotopically Controlled Silicon Heterostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 810 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, C3.3
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- 2004
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Self- and Dopant Diffusion in Extrinsic Boron Doped Isotopically Controlled Silicon Multilayer Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 719 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, F13.11
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- 2002
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Dopant and Self-Diffusion in Extrinsic n-Type Silicon Isotopically Controlled Heterostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 719 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, F13.10
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- 2002
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Diffusion Mechanisms and Intrinsic Point-Defect Properties in Silicon
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- Journal:
- MRS Bulletin / Volume 25 / Issue 6 / June 2000
- Published online by Cambridge University Press:
- 31 January 2011, pp. 22-27
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- June 2000
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Modeling of Atom Diffusion and Segregation in Semiconductor Heterostructures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 490 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 93
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- 1997
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