7 results
Cross-section of Asbestos Prepared for TEM/STEM with Ion Slicer
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 14-15
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- July 2010
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TEM and STEM Tomography for thick polymer sample
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 630-631
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- July 2009
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Measurement of multiphoton absorption and electron avalanche in optical thin films
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- Laser and Particle Beams / Volume 11 / Issue 1 / March 1993
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- 09 March 2009, pp. 55-64
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An Application of a Thin Film Preparation Apparatus with a Broad Ar Ion Beam (Ion Slicer) to Corrosion of a Gold Plated Copper Alloy
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1092-1093
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- August 2007
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Direct Determination of Spatial Alignments of Metal Nanoparticles in Bicontinuous Polymer Matrix Studied by Transmission Electron Microtomography
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 304-305
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- August 2005
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Advantage of Zero-Loss Imaging in Transmission Electron Microtomography
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
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- 01 August 2005, pp. 298-299
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- August 2005
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Automated Electron Tomography Software for High -Precision, 3-D Reconstructions
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 842-843
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- August 2002
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