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Advantage of Zero-Loss Imaging in Transmission Electron Microtomography

Published online by Cambridge University Press:  01 August 2005

Y Nishikawa ,
H Nishioka ,
T Kaneko ,
T Nishi  and
H Jinnai
Y Nishikawa
Affiliation:
Kyoto Insitute of Technology, Japan
H Nishioka
Affiliation:
Kyoto Insitute of Technology, Japan
T Kaneko
Affiliation:
Kyoto Insitute of Technology, Japan
T Nishi
Affiliation:
Tokyo Institute of Technology, Japan
H Jinnai
Affiliation:
Kyoto Insitute of Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 298 - 299
Copyright
© 2005 Microscopy Society of America