Hostname: page-component-76fb5796d-vfjqv Total loading time: 0 Render date: 2024-04-25T10:59:50.784Z Has data issue: false hasContentIssue false
  • English
  • Français

An Application of a Thin Film Preparation Apparatus with a Broad Ar Ion Beam (Ion Slicer) to Corrosion of a Gold Plated Copper Alloy

Published online by Cambridge University Press:  05 August 2007

N Endo ,
H Takahashi ,
H Nishioka  and
M Kersker
N Endo
Affiliation:
JEOL Ltd
H Takahashi
Affiliation:
JEOL Ltd
H Nishioka
Affiliation:
JEOL Ltd
M Kersker
Affiliation:
JEOL USA
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 1092 - 1093
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)