5 results
Interface Effect on the Transverse Thermal Conductivity of SiO2 Films Deposited on Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 516 / January 1998
- Published online by Cambridge University Press:
- 10 February 2011, 51
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- January 1998
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Electrostatic Adhesion Testing for the Evaluation of Metallization Adhesion
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- Journal:
- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 63
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- 1997
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Electronics Application for Fullerenes
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- Journal:
- MRS Online Proceedings Library Archive / Volume 349 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 205
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- 1994
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Effeci of Stresses on Void Nucleation During Electromigration
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- Journal:
- MRS Online Proceedings Library Archive / Volume 239 / 1991
- Published online by Cambridge University Press:
- 22 February 2011, 689
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- 1991
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Mechanical Testing of Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 130 / 1988
- Published online by Cambridge University Press:
- 22 February 2011, 77
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- 1988
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