5 results
Comparative study of the oxide scale thermally grown on titanium alloys by ion beam analysis techniques and scanning electron microscopy
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- Journal:
- Journal of Materials Research / Volume 23 / Issue 8 / August 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2245-2253
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- August 2008
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Effect of crystal defects on the electrical behaviour of InP and SiGe epitaxial structures
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- Journal:
- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
- Published online by Cambridge University Press:
- 15 July 2004, pp. 189-192
- Print publication:
- July 2004
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Eu-doped Yttria and Lutetia Thin Films Grown on Sapphire by PLD
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- Journal:
- MRS Online Proceedings Library Archive / Volume 817 / 2004
- Published online by Cambridge University Press:
- 15 March 2011, L6.21
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- 2004
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Light Emission Versus Excitation from Porous Structures in Ion-Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 653
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- 1994
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Analysis of High Dose Implanted Silicon by High Depth Resolution Rbs and Spectroscopic Ellipsometry and TEM
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- Journal:
- MRS Online Proceedings Library Archive / Volume 35 / 1984
- Published online by Cambridge University Press:
- 25 February 2011, 523
- Print publication:
- 1984
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