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Noise of a-Si:H Pin Diode Pixels in Imagers at Different Operating Conditions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 557 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 869
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- 1999
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UV Imager in TFA Technology
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- Journal:
- MRS Online Proceedings Library Archive / Volume 557 / 1999
- Published online by Cambridge University Press:
- 15 February 2011, 815
- Print publication:
- 1999
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PHOTO- AND DARK CURRENT NOISE IN a-Si:H PIN DIODES AT FORWARD AND REVERSE BIAS
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- Journal:
- MRS Online Proceedings Library Archive / Volume 507 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 175
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- 1998
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New Method to Determine the a-Si:H Pin Diode Series Resistance by Noise Measurements
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- Journal:
- MRS Online Proceedings Library Archive / Volume 507 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 169
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- 1998
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Image Sensors in Tfa Technology - Status and Future Trends
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- Journal:
- MRS Online Proceedings Library Archive / Volume 507 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 327
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- 1998
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