5 results
Fast Automatic Point Spread Function Deconvolution Using Edge Detection
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 3076-3077
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Atomic Layer Deposition and Vapor Deposited SAMS in a CrossBeam FIB-SEM Platform: A Path To Advanced Materials Synthesis
-
- Journal:
- Microscopy Today / Volume 17 / Issue 2 / March 2009
- Published online by Cambridge University Press:
- 14 March 2018, pp. 18-25
- Print publication:
- March 2009
-
- Article
-
- You have access
- Export citation
6 - High-density FIB-SEM 3D nanotomography: with applications of real-time imaging during FIB milling
-
-
- Book:
- Focused Ion Beam Systems
- Published online:
- 12 January 2010
- Print publication:
- 13 September 2007, pp 146-186
-
- Chapter
- Export citation
A Three Beam Approach to TEM Preparation Using In-situ Low Voltage Argon Ion Final Milling in a FIB-SEM Instrument
-
- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 830-831
- Print publication:
- August 2005
-
- Article
-
- You have access
- Export citation
State-of-the-Art X-Ray Photoelectron Spectroscopy (XPS): Conventional and Synchrotron X-Ray Sources for Micro-XPS
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 524 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 221
- Print publication:
- 1998
-
- Article
- Export citation