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Fast Automatic Point Spread Function Deconvolution Using Edge Detection

Published online by Cambridge University Press:  22 July 2022

Zachary E. Russell*
Affiliation:
Ion Innovations, Boone, NC, United States
Mathieu Therezien
Affiliation:
Ion Innovations, Boone, NC, United States
Tomas J. McIntee
Affiliation:
Ion Innovations, Boone, NC, United States
Shane T. DiDona
Affiliation:
Ion Innovations, Boone, NC, United States
Jeffrey J. Haggen
Affiliation:
Synchrotron Research Institute, Melbourne Beach, FL, United States
Edward L. Principe
Affiliation:
Synchrotron Research Institute, Melbourne Beach, FL, United States
*
*Corresponding author: zach.russell@ion-innovations.com

Abstract

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Type
Artificial Intelligence, Instrument Automation, And High-dimensional Data Analytics for Microscopy and Microanalysis
Copyright
Copyright © Microscopy Society of America 2022

References

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Funding in part from the NIST Awards SB1341-15-CN-0050, SB1341-16-SE-0203, SB1341-17-CN-0029; and the Sensors Directorate of Air Force Research Labs (AFRL/RYD) under Contract No. FA8650-17-F-1047.Google Scholar