4 results
Effects of HfO2 buffer layer thickness on the properties of Pt/SrBi2Ta2O9/HfO2/Si structure
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- Journal:
- Journal of Materials Research / Volume 23 / Issue 7 / July 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2023-2032
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- July 2008
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Nanocrystalline Pt interfacial layer formed by stress in a SrBi2Ta2O9–Pt–Ti ferroelectric capacitor
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- Journal:
- Journal of Materials Research / Volume 22 / Issue 6 / June 2007
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1718-1725
- Print publication:
- June 2007
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Influence of Ta content on the physical properties of SrBi2Ta2O9 ferroelectric thin films
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- Journal:
- Journal of Materials Research / Volume 21 / Issue 12 / December 2006
- Published online by Cambridge University Press:
- 03 March 2011, pp. 3124-3133
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- December 2006
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Improvement in Ferroelectric Properties of Sol-Gel Derived SrBi2Ta2O9 thin films with seeding layers
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- Journal:
- MRS Online Proceedings Library Archive / Volume 718 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, D10.11
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- 2002
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