14 results
Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO3 Using Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 2 / April 2017
- Published online by Cambridge University Press:
- 20 February 2017, pp. 329-335
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- April 2017
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Influence of Laser-Pulse Energy on Field Evaporation of LaAlO3in Atom Probe Tomography Analysis
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1604-1605
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- July 2016
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DirectIn situObservation of Tempering-induced Austenite Decomposition and Atom Probe Analyses ofk-Carbide Precipitates in Lightweight Fe-Mn-Al-C Steels
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 704-705
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- July 2016
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Composition Fluctuation of In and Well-Width Fluctuation in InGaN/GaN Multiple Quantum Wells in Light-Emitting Diode Devices
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- Microscopy and Microanalysis / Volume 19 / Issue S5 / August 2013
- Published online by Cambridge University Press:
- 06 August 2013, pp. 99-104
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- August 2013
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Atom Probe Tomography of Compound Semiconductors for Photovoltaic and Light-Emitting Device Applications
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- Microscopy Today / Volume 20 / Issue 3 / May 2012
- Published online by Cambridge University Press:
- 03 May 2012, pp. 18-24
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- May 2012
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Surface evolution of strained SrRuO3 films deposited at various temperatures on SrTiO3 (001) substrates
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- Journal of Materials Research / Volume 21 / Issue 6 / June 2006
- Published online by Cambridge University Press:
- 01 June 2006, pp. 1550-1560
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- June 2006
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Topography Evolution of Si (001) Substrate Fabricated by Ar+ Ion Beam Sputter Etching
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- MRS Online Proceedings Library Archive / Volume 849 / 2004
- Published online by Cambridge University Press:
- 01 February 2011, KK3.6
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- 2004
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Surface engineering of SrTiO3 (111) substrates for the epitaxial growth of BLT films
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- MRS Online Proceedings Library Archive / Volume 839 / 2004
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- 01 February 2011, P3.15
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- 2004
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Optical Properties of Multi-layer Chalcogenide Thin Film for Optical Recording Media
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- MRS Online Proceedings Library Archive / Volume 803 / 2003
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- 01 February 2011, HH4.7
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- 2003
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Mechanisms of misfit strain relaxation in epitaxially grown BLT (Bi4-xLaxTi3O12, x = 0.75) thin films
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- MRS Online Proceedings Library Archive / Volume 779 / 2003
- Published online by Cambridge University Press:
- 15 February 2011, W5.23
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- 2003
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Electrical Properties of Bi 3.25 La 0.75 Ti3O12 Thin Films with Various Grain Orientations Deposited by r.f. Magnetron Sputtering
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- MRS Online Proceedings Library Archive / Volume 768 / 2003
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- 02 August 2011, G3.15
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- 2003
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Plasma Enhanced Atomic Layer Deposition of ZrO2 Gate Dielectric
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- MRS Online Proceedings Library Archive / Volume 716 / 2002
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- 01 February 2011, B2.1
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- 2002
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Growth behavior and defects in conductive SrRuO3 thin films grown on a Si(100) substrate by sputtering
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- Journal of Materials Research / Volume 16 / Issue 7 / July 2001
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1998-2006
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- July 2001
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Nano-scale Interfacial Reactions of SrRuO3 Thin Film on Si (100) Substrate
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- MRS Online Proceedings Library Archive / Volume 666 / 2001
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- 21 March 2011, F7.8
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- 2001
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