15 results
Comparison of 2,4-D, dicamba and halauxifen-methyl alone or in combination with glyphosate for preplant weed control
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- Weed Technology / Volume 35 / Issue 1 / February 2021
- Published online by Cambridge University Press:
- 18 August 2020, pp. 93-98
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Cotton tolerance to halauxifen-methyl applied preplant
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- Weed Technology / Volume 33 / Issue 4 / August 2019
- Published online by Cambridge University Press:
- 24 June 2019, pp. 620-626
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Defects in SiC substrates and epitaxial layers affecting semiconductor device performance
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- The European Physical Journal - Applied Physics / Volume 27 / Issue 1-3 / July 2004
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- 15 July 2004, pp. 29-35
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- July 2004
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Characterization of Thick 4H-SiC Hot-Wall CVD Layers
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- MRS Online Proceedings Library Archive / Volume 572 / 1999
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- 10 February 2011, 167
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- 1999
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5.5 kV Bipolar Diodes From High Quality CVD 411-SiC
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- MRS Online Proceedings Library Archive / Volume 512 / 1998
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- 10 February 2011, 119
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- 1998
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A Theoretical and Empirical Perspective of SiC Bulk Growth
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- MRS Online Proceedings Library Archive / Volume 512 / 1998
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- 10 February 2011, 89
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- 1998
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Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs
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- MRS Online Proceedings Library Archive / Volume 524 / 1998
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- 10 February 2011, 71
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- 1998
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Connectivity and flux pinning improvements in Ag-clad BSCCO-2223 tapes produced by changes in the cooling rate
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- Journal of Materials Research / Volume 12 / Issue 11 / November 1997
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2997-3008
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- November 1997
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High Power and High Frequency Silicon Carbide Devices
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- MRS Online Proceedings Library Archive / Volume 339 / 1994
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- 21 February 2011, 133
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- 1994
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Synchrotron White Beam Topography Studies of Screw Dislocations in 6H-Sic Single Crystals
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- MRS Online Proceedings Library Archive / Volume 375 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 281
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- 1994
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X-Ray Topographic Studies of Defects in PVT 6H-SiC Substrates and Epitaxial 6H-SiC Thin Films
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- MRS Online Proceedings Library Archive / Volume 339 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 735
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- 1994
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Characterization of Defect Structures in SiC Single Crystals Using Synchrotron X-Ray Topography
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- MRS Online Proceedings Library Archive / Volume 307 / 1993
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- 15 February 2011, 249
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- 1993
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Growth, Doping, Device Development and Characterization of CVD Beta-SiC Epilayers on Si(100) and Alpha-SiC(0001)
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- MRS Online Proceedings Library Archive / Volume 97 / 1987
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- 25 February 2011, 233
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- 1987
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Transmission electron microscopy of process-induced defects in β-SiC thin films
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- Journal of Materials Research / Volume 1 / Issue 6 / December 1986
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- 29 June 2016, pp. 811-819
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- December 1986
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The Occurrence of Defects in Silicon Carbides as a Result of Processing Mode and Applied Stress
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- MRS Online Proceedings Library Archive / Volume 24 / 1983
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- 21 February 2011, 351
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- 1983
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