5 results
Analytical High-Resolution Studies of Transparent Conductive Oxides and their Interfaces with Active Si Regions for Photovoltaic Applications
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1340-1341
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- August 2008
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Characterization of Nitrogen Content/Distribution in SiON Gate Dielectrics using Angle-Resolved X-Ray Photoelectron Spectroscopy (AR-XPS) and Aberration Corrected Scanning Transmission Electron Spectroscopy (Cs-STEM)
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 856-857
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- August 2007
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Nickel silicon thin film as barrier in under-bump-metallization by magnetronsputtering deposition for Pb-free chip packaging
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- Journal:
- Journal of Materials Research / Volume 20 / Issue 10 / October 2005
- Published online by Cambridge University Press:
- 03 March 2011, pp. 2622-2626
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- October 2005
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Micro-Raman Characterization of Phase Formation and Thermal Stability of Nickel Silicide Thin Films.
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2094-2095
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- August 2005
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Demonstration of the state-of-the-art of formation and characterization of ultra-shallow junctions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 669 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, J2.4
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- 2001
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