7 results
Composition Analysis by STEM-EDX of Ternary Semiconductors by Internal References
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue 1 / February 2022
- Published online by Cambridge University Press:
- 25 November 2021, pp. 61-69
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- February 2022
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STEM-based analysis of functional defects in ferroelectric ErMnO3
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 1188-1189
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- August 2021
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Crystal Phase Mapping by Scanning Precession Electron Diffraction and Machine Learning Decomposition
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 586-587
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- August 2018
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Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 806-807
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- August 2018
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Structural Characterization of Natural Quartz by Scanning TEM
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2044-2045
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- August 2018
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Nanoscale Strain Tomography by Scanning Precession Electron Diffraction
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1710-1711
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- July 2017
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Visualising the Three-dimensional Morphology and Surface Structure of Metallic Nanoparticles at Atomic Resolution by Automated HAADF STEM Atom Counting
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 60-61
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- August 2014
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