36 results
Resolution of the Electron Microscope at the Atomic Scale
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 592-593
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- August 2013
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PPEREM: Post-Processed Extended-Resolution Electron Microscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1706-1707
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- July 2012
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A Stable Double-Tilt Heating Capability for Precision Atomic-Level Imaging of Catalysts at Elevated Temperatures
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 468-469
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- July 2011
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CCEREM: Critical-Convergence Extended-Resolution Electron Microscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 1264-1265
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- July 2011
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Elevated Temperature Observation of Selective Oxidation Catalyst M1 Along [001]
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 482-483
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- July 2011
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Aberration-Corrected STEM Imaging Through Off-Site Remote Operation
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1330-1331
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- July 2010
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Defining HRTEM Resolution: Image Resolutions and Microscope Limits
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 766-767
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- July 2010
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Defining HRTEM Resolution: Why Youngs Fringes Don't Measure Resolution
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1470-1471
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- July 2009
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Analysis of Catalysts using Aberration-Corrected TEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 1390-1391
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- August 2008
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Young’s Fringes Are Not Evidence of HRTEM Resolution
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 834-835
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- August 2008
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Functional Collaborative Remote Microscopy: Inter-Continental Atomic Resolution Imaging
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- Microscopy Today / Volume 16 / Issue 3 / May 2008
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- 14 March 2018, pp. 46-49
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- May 2008
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Aberration-Corrected STEM Imaging of Ag on γ-Al2O3
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- Microscopy and Microanalysis / Volume 14 / Issue 1 / February 2008
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- 21 December 2007, pp. 98-103
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- February 2008
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Tackling the Size Problem: Seeing Atoms Smaller for Better TEM Resolution
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 872-873
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- August 2007
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Aberration-Corrected STEM ex-situ Studies of Catalysts
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1192-1193
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- August 2007
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High Resolution Electron Microscopy of Bimetallic Nanoparticles
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 84-85
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- August 2007
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Studies of Cluster Evolution During Reduction of Pt/Alumina Catalysts
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 868-869
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- August 2007
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Functional Remote Microscopy via the AtlanTICC Alliance
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 1702-1703
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- August 2007
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Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory
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- Microscopy and Microanalysis / Volume 12 / Issue 6 / December 2006
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- 11 October 2006, pp. 483-491
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- December 2006
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Observation of Pt Atoms, Clusters and Rafts on Oxide Supports, by Sub-Ångström Z-Contrast Imaging in an Aberration-Corrected STEM/TEM
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 50-51
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- August 2006
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Accurate Objective Lens Defocus Calibration for Focal-Series Aberration-Corrected HRTEM at Sub-Ångström Resolution
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1472-1473
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- August 2006
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