6 results
Added Information to TEM Samples by Chemical Stain – Applications to Silicon Devices
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1626-1627
- Print publication:
- August 2006
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Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site
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- Journal:
- Microscopy Today / Volume 13 / Issue 1 / January 2005
- Published online by Cambridge University Press:
- 14 March 2018, pp. 26-29
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- January 2005
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Preparation of Large Area Site Specific Plan View TEM Samples by Combining Focused Ion Beam and Etching Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1162-1163
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- August 2004
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Having Your Cake and Eating It Too: A Procedure for Obtaining Plan View and Cross Section TEM Images from the Same Site
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S02 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 1146-1147
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- August 2004
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Further Applications of Energy Filtered TEM in Semiconductor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 626-627
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- August 2002
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FIB/TEM Sample Preparation using a Wafer Dicing Saw
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 500-501
- Print publication:
- August 2000
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