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12 - Amplifier measurements

Published online by Cambridge University Press:  05 November 2011

Michael Hiebel
Affiliation:
Rohde and Schwarz GmbH & Co. KG.
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Summary

Introduction

The measurement results obtained in this chapter are the major factors that justify the price of an RF amplifier. The first test results of a new prototype are used for optimization purposes. Once the product is released, production-line testing with a manageable test depth takes place. Important properties are tested on each sample during final production-line testing.

Inaccurate testing can lead to additional cost-intensive design cycles or negatively affect the relationship between the manufacturer and customer. It may even lead to legal consequences. Accurate RF testing is a complex topic, and this chapter can only provide an overview. The information provided in this chapter was prepared with utmost care but it cannot be assumed to be complete or free of errors. This chapter is meant to be academic in nature; it cannot replace engineering or other professional services. The power levels covered in this book make it necessary to consider national and international safety regulations, e.g., for nonionizing radiation. The reader is advised to consult the applicable versions of the regulations.

Type
Chapter
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Publisher: Cambridge University Press
Print publication year: 2011

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References

Reichel, T.Voltage and Power MeasurementsRohde & Schwarz GmbH & Co. KGMunich, Germany 1999 www.rohde-schwarz.comGoogle Scholar
Buschbeck, W.Hochfrequenz-Wattmeter und Fehlanpassungsmesser mit direkter Anzeige [translation: RF power meter and mismatch tester with direct indication]Hochfrequenz und Elektroakustik 61 93 1943Google Scholar
Hupfer, K. 1994
Hiebel, M.Fundamentals of Vector Network AnalysisRohde & Schwarz GmbH & CoKG, Munich, Germanyth 2008 www.books.rohde-schwarz.comGoogle Scholar
Anonymous 2007
Kouzaev, G. A.J. Deen, M.Nikolova, N. K.Rahal, A. H.Cavity models of planar components grounded by via-holes and their experimental verificationIEEE Trans. Microw. Theory Tech541033 2006Google Scholar
Sokol, V.Hoffmann, K. 2003 245
Benahmed, N.Benmostefa, N.90 2006
Anonymous 1995
Ostwald, O. 1998 www.rohde-schwarz.com
Rollet, J. M.Stability and power gain invariants of linear two-portsIRE Trans. Circuit Theory CT-9 29 1962CrossRefGoogle Scholar
Edwards, M. L.Sinsky, J. H.A new criterion for linear 2-port stability using a single geometrically derived parameterIEEE Trans. Microw. Theory Tech 40 2303 1992CrossRefGoogle Scholar
Bockelman, D. EEisenstadt, W. RCombined differential and common-mode scattering parameters: theory and simulationIEEE Trans. Microw. Theory Tech 43 1530 1995CrossRefGoogle Scholar
Frei, J.Cai, X.-D.Muller, S.Multiport S-parameter and T-parameter conversion with symmetry extensionIEEE Trans. Microw. Theory Tech 56 2493 2008CrossRefGoogle Scholar
Winder, S. 1993
Agahi, D.Domino, W.Vakilian, N82 2002
Van den Bossche, Mwww.nmdg.be/ZVxPlus.html
Gasseling, T.Barataud, D.Mons, S.Nebus, J.-M.Villotte, J. P.Obregon, J. J.Quere, R.Hot small-signal S-parameter measurements of power transistors operating under large-signal conditions in a load-pull environment for the study of nonlinear parametric interactionsIEEE Trans. Microw. Theory Tech 52 805 2004CrossRefGoogle Scholar
Martens, J.Kapetanic, P.Probe-tone S-parameter measurementsIEEE Trans. Microw. Theory Tech 50 2076 2002CrossRefGoogle Scholar
Kaehs, B. 2007 www.rohde-schwarz.com
Wolf, J. 1998 www.rohde-schwarz.com
Minihold, R. 2009 www.rohde-schwarz.com
Friis, H. T.Noise figures of radio receiversProc IRE 32 419 1944CrossRefGoogle Scholar
Escotte, L.Gonneau, E.Chamborn, C.Graffeuil, J.Noise behavior of microwave amplifiers operating under nonlinear conditionsIEEE Trans. Microw.Theory Tech 53 3704 2005CrossRefGoogle Scholar
Tiemeijer, L. F.Havens, R. J.de Kort, RandyScholten, A. J.Improved Y-factor methode for wide-band on-wafer noise-paramater measurementsIEEE Trans. Microw. Theory and Tech532917 2005Google Scholar
Davidson, A. C.Leake, B. W.Strid, E.Accuracy improvements in microwave noise parameter measurementsIEEE Trans. Microw. Theory Tech371973 1989Google Scholar

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