Skip to main content Accessibility help
×
Hostname: page-component-76fb5796d-25wd4 Total loading time: 0 Render date: 2024-04-28T17:57:38.326Z Has data issue: false hasContentIssue false

4 - Resolution and localization

Published online by Cambridge University Press:  05 November 2012

Lukas Novotny
Affiliation:
University of Rochester, New York and ETH Zürich, Switzerland
Bert Hecht
Affiliation:
Julius-Maximilians-Universität Würzburg, Germany
Get access

Summary

Localization refers to the precision with which the position of an object can be defined. Spatial resolution, on the other hand, is a measure of the ability to distinguish two separated point-like objects from a single object. The diffraction limit implies that optical resolution is ultimately limited by the wavelength of light. Before the advent of near-field optics it was believed that the diffraction limit imposes a hard boundary and that physical laws strictly prohibit resolution significantly better than λ/2. It was then found that this limit is not as strict as assumed and that access to evanescent modes of the spatial spectrum offers a direct route to overcome the diffraction limit. However, further critical analysis of the diffraction limit revealed that “super-resolution” can also be obtained by pure far-field imaging under certain constraints. In this chapter we analyze the diffraction limit and discuss the principles of different imaging modes with resolutions near or beyond the diffraction limit.

The point-spread function

The point-spread function is a measure of the resolving power of an optical system. The narrower the point-spread function the better the resolution will be. As the name implies, the point-spread function defines the spread of a point source. If we have a radiating point source then the image of that source will appear to have a finite size. This broadening is a direct consequence of spatial filtering. A point in space is characterized by a delta function that has an infinite spectrum of spatial frequencies kx and ky.

Type
Chapter
Information
Publisher: Cambridge University Press
Print publication year: 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] C. J. R., Sheppard and T., Wilson, “The image of a single point in microscopes of large numerical aperture,” Proc. Roy. Soc.A 379, 145–158 (1982).Google Scholar
[2] J., Enderlein, “Theoretical study of detection of a dipole emitter through an objective with high numerical aperture,” Opt. Lett. 25, 634–636 (2000).Google Scholar
[3] R.M., Dickson, D. J., Norris, and W. E., Moerner, “Simultaneous imaging of individual molecules aligned both parallel and perpendicular to the optic axis,” Phys. Rev. Lett. 81, 5322–5325 (1998).Google Scholar
[4] M. A., Lieb, J. M., Zavislan, and L., Novotny, “Single molecule orientations determined by direct emission pattern imaging,” J. Opt. Soc.B 21, 1210–1215 (2004).Google Scholar
[5] E., Abbe, “Beiträge zur Theorie des Mikroskops und des mikroskopischen Wahrnehmung,” Arch. Mikrosk. Anat. 9, 413–468 (1873).Google Scholar
[6] Lord, Rayleigh, “On the theory of optical images with special reference to the microscope,” Phil. Mag. 5, 167–195 (1896).Google Scholar
[7] R. H., Webb, “Confocal optical microscopy,” Rep. Prog. Phys. 59, 427–471 (1996).Google Scholar
[8] V., Andresen, A., Egner, and S. W., Hell, “Time-multiplexed multifocal multiphoton microscope,” Opt. Lett. 26, 75–77 (2001).Google Scholar
[9] T. A., Klar, S., Jakobs, M., Dyba, A., Egner, and S. W., Hell, “Fluorescence microscopy with diffraction resolution barrier broken by stimulated emission,” Proc. Nat. Acad. Sci. 97, 8206–8210 (2000).Google Scholar
[10] M., Minsky, “Memoir on inventing the confocal scanning microscope,” Scanning 10, 128–138 (1988).Google Scholar
[11] C. J. R., Sheppard, D. M., Hotton, and D., Shotton, Confocal Laser Scanning Microscopy. New York: BIOS Scientific Publishers (1997).Google Scholar
[12] G., Kino and T., Corle, Confocal Scanning Optical Microscopy and Related Imaging Systems. New York: Academic Press (1997).Google Scholar
[13] T., Wilson, Confocal Microscopy. New York: Academic Press (1990).Google Scholar
[14] N., Bobroff, “Position measurement with a resolution and noise-limited instrument,” Rev. Sci. Instrum. 57, 1152–1157 (1986).Google Scholar
[15] R. E., Thompson, D. R., Larson, and W. W., Webb, “Precise nanometer localization analysis for individual fluorescent probes,” Biophys. J. 82, 2775–2783 (2002).Google Scholar
[16] R. J., Ober, S., Ram, and E. S., Ward, “Localization accuracy in single-molecule microscopy,” Biophys. J. 86, 1185–1200 (2004).Google Scholar
[17] A., Yildiz, J. N., Forkey, S. A., McKinney, et al., “Myosin V walks hand-over-hand: single fluorophore imaging with 1.5-nm localization,” Science 300, 2061–2065 (2003). Reprinted with permission from AAAS.Google Scholar
[18] W., Trabesinger, B., Hecht, U. P., Wild, et al., “Statistical analysis of single-molecule colocalization assays,” Anal. Chem. 73, 1100–1105 (2001).Google Scholar
[19] E., Betzig, G. H., Patterson, R., Sougrat, et al., “Imaging intracellular fluorescent proteins at nanometer resolution,” Science 313, 1642–1645 (2006).Google Scholar
[20] M. J., Rust, M., Bates, and X., Zhuang, “Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM),” Nature Methods 3, 793–795 (2006).Google Scholar
[21] S. T., Hess, T. P. K., Girirajan, and M. D., Mason, “Ultra-high resolution imaging by fluorescence photoactivation localization microscopy,” Biophys. J. 91, 4258–4272 (2006).Google Scholar
[22] P. R., Bevington and D. K., Robinson, Data Reduction and Error Analysis for the Physical Sciences. New York: McGraw-Hill, p. 212 (1994).Google Scholar
[23] M., Lampton, B., Margon, and S., Bowyer, “Parameter estimation in X-ray astronomy,” Astrophys. J. 208, 177–190 (1976).Google Scholar
[24] H. A., Bethe, “Theory of diffraction by small holes,” Phys. Rev. 66, 163–182 (1944).Google Scholar
[25] C. J., Bouwkamp, “On Bethe's theory of diffraction by small holes,” Philips Res. Rep. 5, 321–332 (1950).Google Scholar
[26] D., Van Labeke, D., Barchiesi, and F., Baida, “Optical characterization of nanosources used in scanning near-field optical microscopy,” J. Opt. Soc. Am.A 12, 695–703 (1995).Google Scholar
[27] D., Barchiesi and D., Van Labeke, “Scanning tunneling optical microscopy: theoretical study of polarization effects with two models of tip,” in Near-field Optics, ed. D. W., Pohl and D., Courjon. Dordrecht: Kluwer, pp. 179–188 (1993).Google Scholar
[28] J.-J., Greffet and R., Carminati, “Image formation in near-field optics,” Prog. Surf. Sci. 56, 133–237 (1997).Google Scholar
[29] B., Hecht, H., Bielefeld, D. W., Pohl, L., Novotny, and H., Heinzelmann, “Influence of detection conditions on near-field optical imaging,” J. Appl. Phys. 84, 5873–5882 (1998).Google Scholar
[30] B., Hecht, H., Bielefeldt, L., Novotny, Y., Inouye, and D. W., Pohl, “Facts and artifacts in near-field optical microscopy,” J. Appl. Phys. 81, 2492–2498 (1997).Google Scholar
[31] Y., Xia and G. M., Whitesides, “Soft lithography,” Angew. Chem. Int. Edn. Engl. 37, 551–575 (1998).Google Scholar
[32] W., Lukosz and M., Marchand,“Optische Abbildung unter Überschreitung der beugungsbedingten Auflösungsgrenze,” J. Mod. Opt. 10, 241–255 (1963).Google Scholar
[33] M. G. L., Gustafsson, D. A., Agard, and J.W., Sedat, “Method and apparatus for three-dimensional microscopy with enhanced depth resolution,” US patent 5671085, cols. 23–25 (1997).Google Scholar
[34] M. G. L., Gustafsson, “Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy,” J. Microsc. 198, 82–87 (2000).Google Scholar
[35] R., Heintzmann and C., Cremer, “Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating,” Proc. SPIE 3568, 185–196 (1999).Google Scholar
[36] J. T., Frohn, H. F., Knapp, and A., Stemmer, “True optical resolution beyond the Rayleigh limit achieved by standing wave illumination,” Proc. Nat. Acad. Sci. 97, 7232–7236 (2000).Google Scholar
[37] M. A. A., Neil, R., Juskaitis, and T., Wilson, “Method of obtaining optical sectioning by using structured light in a conventional microscope,” Opt. Lett. 22, 1905–1907 (1997).Google Scholar
[38] C. B., Müller and J., Enderlein, “Image scanning microscopy,” Phys. Rev. Lett. 104, 198101 (2010).Google Scholar
[39] M. G. L., Gustafsson, “Nonlinear structured-illumination microscopy: wide-field fluorescence imaging with theoretically unlimited resolution,” Proc. Nat. Acad. Sci. 102, 13081–13086 (2005). Copyright 2005 National Academy of Sciences, U.S.A.Google Scholar

Save book to Kindle

To save this book to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Available formats
×

Save book to Dropbox

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Dropbox.

Available formats
×

Save book to Google Drive

To save content items to your account, please confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your account. Find out more about saving content to Google Drive.

Available formats
×