Microscopy and Microanalysis: Volume 22 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Volume 22 - February 2016

Technologist Forum, Tutorials and Outreach Symposia

Technologists’ Forum - Special Topic: A Practical Approach to Current Software Solutions and Their Applications

Abstract

Advanced Platform for 3D Visualization, Reconstruction, and Segmentation with Electron Tomography

A Digital Micrograph Script for Detection of Astigmatism in TEM Images

Technologists’ Forum - Roundtable Discussion on Artifacts

Abstract

Recognizing and Preventing Artifacts in Microscopy: A Roundtable Discussion

Career Tracks in Government and Industry

Abstract

Navigating the Job Market for Careers Inside and Outside of Academia.

Effective Tactics for Getting an Equipment Grant

Abstract

Effective Tactics for Getting an Equipment Grant

Building and Validating Atomic Models for EM Density Maps

Abstract

Building and Validating Atomic Models for Cryo-EM Density Maps

Diffraction Mapping and 4D STEM

Abstract

Automated Analysis of Large Datasets Acquired with STEM Diffraction Mapping

Compressive Sensing Applications in Microscopy

Abstract

Compressive Sensing in Microscopy: a Tutorial

Microscopy in the Classroom: Strategies for Education and Outreach and Family Affair

Abstract

The “WOW Factor”: Using Scanning Electron Microscopy to Stimulate Interest in STEM Disciplines

Macro to Micro: Innovation Inspired by Nature

Complex Web Construction: A Possible Clue to Mechanical Properties

Front Cover (OFC, IFC) and matter

MAM volume 22 issue s3 Cover and Front matter

Back Cover (OBC, IBC) and matter

MAM volume 22 issue s3 Cover and Back matter

Microscopy and Microanalysis

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Volume 22 - February 2016

Technologist Forum, Tutorials and Outreach Symposia

Technologists’ Forum - Special Topic: A Practical Approach to Current Software Solutions and Their Applications

Abstract

Technologists’ Forum - Roundtable Discussion on Artifacts

Abstract

Career Tracks in Government and Industry

Abstract

Effective Tactics for Getting an Equipment Grant

Abstract

Building and Validating Atomic Models for EM Density Maps

Abstract

Diffraction Mapping and 4D STEM

Abstract

Compressive Sensing Applications in Microscopy

Abstract

Microscopy in the Classroom: Strategies for Education and Outreach and Family Affair

Abstract

Front Cover (OFC, IFC) and matter

Back Cover (OBC, IBC) and matter