The following fourteen reference patterns of boride, telluride, and oxide ceramics are reported. Included in the fourteen reference patterns are data for six high Tc superconducting oxide and related phases (Ba2CaCu2TI2O8, BaCuEu2O5, BaCuTm2O5, BaCuDy2O5, Ba3.2Cu1.7Y0.8O6.1·xCO2, Sr2Bi2O5). The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40 (1986).
Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled step-scanning diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer method.
Intensities were measured as peak heights above background and were read manually from strip charts. To minimize preferred orientation effects, the powders were passed through a 400 mesh sieve and were mixed with an amorphous diluent, silica gel. Sample mounts were prepared by side-drifting and/or by dusting a thin layer of sample on a glass slide coated with a thin smear of silicone grease.