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Standard X-Ray Diffraction Powder Patterns of Fourteen Ceramic Phases

Published online by Cambridge University Press:  19 May 2016

Winnie Wong-Ng ,
Howard F. McMurdie ,
Boris Paretzkin ,
Madeline A. Kuchinski  and
Alan L. Dragoo
Winnie Wong-Ng
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Howard F. McMurdie
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Boris Paretzkin
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Madeline A. Kuchinski
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
Alan L. Dragoo
Affiliation:
Ceramics Division, National Bureau of Standards, Gaithersburg, Maryland 20899, U.S.A.
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Extract

The following fourteen reference patterns of boride, telluride, and oxide ceramics are reported. Included in the fourteen reference patterns are data for six high Tc superconducting oxide and related phases (Ba2CaCu2TI2O8, BaCuEu2O5, BaCuTm2O5, BaCuDy2O5, Ba3.2Cu1.7Y0.8O6.1·xCO2, Sr2Bi2O5). The general methods of producing these X-ray powder diffraction reference patterns are described in this journal, Vol. 1, No. 1, pg. 40 (1986).

Samples were mixed with one or two internal standards: silicon (SRM640a), silver, tungsten, or fluorophlogopite (SRM675). Expected 2θ values for these internal standards are specified in the methods described (ibid.). Data were measured with a computer controlled step-scanning diffractometer. The POWDER-PATTERN system of computer programs was used to locate peak positions, to calibrate the patterns, and to perform variable indexing and least-squares cell refinement. A check on the overall internal consistency of the data was also provided by a computer method.

Intensities were measured as peak heights above background and were read manually from strip charts. To minimize preferred orientation effects, the powders were passed through a 400 mesh sieve and were mixed with an amorphous diluent, silica gel. Sample mounts were prepared by side-drifting and/or by dusting a thin layer of sample on a glass slide coated with a thin smear of silicone grease.

Type
Research Article
Information
Powder Diffraction , Volume 3 , Issue 3 , September 1988 , pp. 179 - 187
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

1.Marcantonio, J. A. and Mondolfo, L. F. (1970). J. Inst. Metals, 98, 23.Google Scholar
1.Subramanian, M. A., Calabrese, J. C., Torardi, C. C., Gopalakrishnan, , Askew, T. R., Flippen, R. B., Morrissey, K. J., Chowdhry, V. and Sleight, A. W. (1988). Nature, submitted.Google Scholar
1.Michel, C. and Raveau, B. (1982). J. Solid State Chem. 43, 73.Google Scholar
1.Michel, C. and Raveau, B. (1982). J. Solid State Chem. 43, 73.Google Scholar
1.Michel, C. and Raveau, B. (1982). J. Solid State Chem. 43, 73.CrossRefGoogle Scholar
1.Roth, R. S., Rawn, C. J., Beech, F., Whitler, J. D. and Anderson, J. O. (1988). Adv. Cer. Mat., to be published.Google Scholar
1.Townes, W., Fang, J. and Perrotta, A. (1967). Z. Kristallogr. 125, 437.Google Scholar
2.Routil, R. and Barham, D. (1974). Can J. Chem. 52, 3235.Google Scholar
1.Townes, W., Fang, J. and Perrotta, A. (1967). Z. Kristallogr. 125, 437.CrossRefGoogle Scholar
2.Routil, R. and Barham, D. (1974). Can J. Chem. 52, 3235.Google Scholar
1.Goldschmidt, V. M. (1929). Z. Kristallogr. Kristallgeom. Kristallphys. Kristallchem. 69, 411.Google Scholar
2.Haase, M. (1928). Z. Kristallogr. Kristallgeom. Kristallphys. Kristallchem. 68, 121.Google Scholar
1.Galasso, F., and Pyle, J. (1963). J. Phy. Chem. 67, 1561.Google Scholar
1.van der Goot, A. S. and Buschow, K. H. J. (1970). J. Less. Common Metals, 21, 151.CrossRefGoogle Scholar
1.Roth, R. S. (Priv. Comm).Google Scholar
1.Ruddlesden, S. N. and Popper, P. (1957). Acta Crystallogr. 10, 538.Google Scholar
1.Gallasso, F., and Pyle, J. (1963), J. Phy. Chem. 67, 1561.Google Scholar