6745 results in Powder Diffraction & past titles
High Accuracy Analysis of BPSG Thin Films on Silicon Wafers by X-Ray Wafer Analyzer
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 229-234
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- 1993
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Experimental Comparison of Widely Differing Lattice Parameters
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 129-133
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- 1993
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Size/Strain Broadening Analysis of SRM 676 Candidate Materials
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 343-349
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- 1993
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New Empirical Regression Type Algorithm and Software for High Precision XRF Spectrometry
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 657-666
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- 1993
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New Developments in PC-Based Powder Data Retrieval Programs
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 117-121
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- 1993
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X-Ray Stress Measurement of Alloy Steels X-Ray Study of Elastic Deformation for Alloy Steels with Composite Microstructures
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 317-325
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- 1993
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The Use of a Conventional Powder Diffractometer for Thin-Film Thickness Determination From Reflectivity DATA
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 183-188
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- 1993
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Toroidally Shaped Hopg Crystals as Strongly Focusing Bragg Reflectors of Characteristic X-Ray Tube Radiation for Edxrf Analysis
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 523-533
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- 1993
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TXRF High Sensitivity X-Ray Analyzer With Multi-Layer Monochromator
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 599-605
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- 1993
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The Use Of Multilayer Structures in the Energy Dispersive X-Ray Fluorescence Analysis of Low Z Elements
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 535-544
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- 1993
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Why The Fundamental Algorithm is So Fundamental
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 639-646
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- 1993
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Total Reflection Xrf of Light Elements Using Various Excitation Sources
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- Advances in X-ray Analysis / Volume 37 / 1993
- Published online by Cambridge University Press:
- 06 March 2019, pp. 577-583
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- 1993
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Measurement Of Relative X-Ray Intensity Ratios for Elements With Z=14 to 92 Using EDXRF Spectrometer
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 697-709
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- 1993
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Characterization of TiN Film by XRD and XRF
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 175-182
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- 1993
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Matrix Correction With Barkla Excitation Using the Coherent/Incoherent Method
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 667-675
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- 1993
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Analysis of Multi-Layer Thin Films by XRF
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 205-212
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- 1993
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High-Pressure Powder Diffraction Using an Image-Plate Area Detector
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 419-432
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- 1993
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Powder Diffraction Pattern Simulation and Analysis
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 101-107
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- 1993
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Applications of Profile Analysis for Micro-Crystalline Properties From Total Pattern Fitting
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 27-35
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- 1993
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X-Ray Fluorescence Critical Sample Thickness and Volume of Material Excited in Catalysts
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- Advances in X-ray Analysis / Volume 36 / 1992
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- 06 March 2019, pp. 145-154
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- 1992
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