Powder Diffraction: Volume 20 - Issue 2

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

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Volume 20 - Issue 2 - June 2005

Contents

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Denver X-Ray Conference

D004 Micro X-ray Diffraction Imaging of Bulk Polycrystalline Materials
T. Wroblewski, A.A. Bjeoumikhov, B. Hasse
Published online by Cambridge University Press:

20 May 2016, p. 173
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D049 Limited-Projection Topography Comparison of Types IB and IIA Diamonds
Y. Zhong, A. Macrander, S. Krasnicki, Y.S. Chu, J. Maj
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20 May 2016, p. 173
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C08 Applications of Polycapillary Optics in Medical Imaging
W.M. Gibson, C.A. MacDonald
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20 May 2016, p. 173
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D106 Novel Analytical Approaches in Numerical Analysis of XRR and HRXRD Data from Thin Films—Invited
A. Ulyanenkov
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20 May 2016, p. 174
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D013 Influence of Growth Interruption on the Formation of Solid-State Interfaces
J. Stümpel, I. Busch
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20 May 2016, p. 174
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D029 High-Precision Strain Determination of SGOI by High-Resolution In-Plane Diffraction
K. Omote, A. Ogi
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20 May 2016, p. 174
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D087 In-Situ and Real-Time Characterization of MOCVD Growth by X-ray Diffraction
A. Kharchenko, J. Bethke, J. Woitok, K. Lischka, A. Bonanni, C. Simbrunner, H. Sitter
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20 May 2016, p. 174
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F15 Thickness Determination of Copper and Nickel Nanolayers: Comparison of Completely Reference-Free X-ray Fluorescence Analysis and X-ray Reflectometry
M. Kolbe, B. Beckhoff, M. Krumrey, G. Ulm
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20 May 2016, p. 174
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F22 Micro-Thin Film Analysis Using Mono-Capillary with 10-Micrometer Spatial Resolution
Y. Yokota, K. Obori, S. Komatani, S. Ohawa, A. Whitley
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20 May 2016, p. 174
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D085 Synchrotron X-ray Study of Structural Phase Transformations in Continuous and Patterned Ge2Sb2Te5 Phase-Change Material Thin Films
J.L. Jordan-Sweet, S.M. Rossnagel, P.M. Mooney, S. Raoux, C.T. Rettner
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20 May 2016, p. 174
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D084 X-ray and Neutron Diffraction Analysis of ErD2 Films
M.A. Rodriguez, J. Browning, C. Frazer, R. Tissot
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20 May 2016, p. 174
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F70 Ultra-Trace Analysis and Speciation by TXRF-NEXAFS in the Soft X-ray Range—Invited
B. Beckhoff
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20 May 2016, p. 175
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F74 EDXRF with High-Energy Polarized Beam Excitation for Analysis of Aerosol Filters—Invited
R. Van Grieken, Z. Spolnik, K. Van Meel, S. Potgieter-Vermaak
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20 May 2016, p. 175
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F80 Study of Trace Elements in Biological Samples by EDXRF and TXRF—Invited
M.L. Carvalho
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20 May 2016, p. 175
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F03 TXRF Analysis in the PPB to PPM Concentration Range—An Applicative Study
H. Stosnach
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20 May 2016, p. 175
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F50 XRF Analysis at PPB Levels Using Doubly Curved Crystal Optics
Z.W. Chen, W.M. Gibson
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20 May 2016, p. 175
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F56 TXRF Analysis of Drinking Water and Austrian Wine
P. Kregsamer, X. Gruber, P. Wobrauschek, C. Streli
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20 May 2016, p. 175
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F63 Speciation of Nitrogen Compounds in Nanoscopic Fine Aerosol Samples Using TXRF-NEXAFS and Low-Z Particle EPMA
J. Osán, S. Török, B. Beckhoff, G. Ulm, H. Hwang, C.-U. Ro, C. Abete, R. Fuoco
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20 May 2016, p. 175
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F81 Surface Profile Total Reflection X-ray Fluorescence (SP-TXRF) Analysis for Contamination on 300mm Wafers
S. Malloy, M.A. Zaitz
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20 May 2016, p. 175
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D105 Microtomographic Imaging and Analysis for Basic Research—Invited
J.H. Dunsmuir
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20 May 2016, p. 176
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Page 3 of 8

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Powder Diffraction

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Volume 20 - Issue 2 - June 2005

Denver X-Ray Conference

D004 Micro X-ray Diffraction Imaging of Bulk Polycrystalline Materials

D049 Limited-Projection Topography Comparison of Types IB and IIA Diamonds

C08 Applications of Polycapillary Optics in Medical Imaging

D106 Novel Analytical Approaches in Numerical Analysis of XRR and HRXRD Data from Thin Films—Invited

D013 Influence of Growth Interruption on the Formation of Solid-State Interfaces

D029 High-Precision Strain Determination of SGOI by High-Resolution In-Plane Diffraction

D087 In-Situ and Real-Time Characterization of MOCVD Growth by X-ray Diffraction

F15 Thickness Determination of Copper and Nickel Nanolayers: Comparison of Completely Reference-Free X-ray Fluorescence Analysis and X-ray Reflectometry

F22 Micro-Thin Film Analysis Using Mono-Capillary with 10-Micrometer Spatial Resolution

D085 Synchrotron X-ray Study of Structural Phase Transformations in Continuous and Patterned Ge2Sb2Te5 Phase-Change Material Thin Films

D084 X-ray and Neutron Diffraction Analysis of ErD2 Films

F70 Ultra-Trace Analysis and Speciation by TXRF-NEXAFS in the Soft X-ray Range—Invited

F74 EDXRF with High-Energy Polarized Beam Excitation for Analysis of Aerosol Filters—Invited

F80 Study of Trace Elements in Biological Samples by EDXRF and TXRF—Invited

F03 TXRF Analysis in the PPB to PPM Concentration Range—An Applicative Study

F50 XRF Analysis at PPB Levels Using Doubly Curved Crystal Optics

F56 TXRF Analysis of Drinking Water and Austrian Wine

F63 Speciation of Nitrogen Compounds in Nanoscopic Fine Aerosol Samples Using TXRF-NEXAFS and Low-Z Particle EPMA

F81 Surface Profile Total Reflection X-ray Fluorescence (SP-TXRF) Analysis for Contamination on 300mm Wafers

D105 Microtomographic Imaging and Analysis for Basic Research—Invited

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Volume 20 - Issue 2 - June 2005

Denver X-Ray Conference