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F74 EDXRF with High-Energy Polarized Beam Excitation for Analysis of Aerosol Filters—Invited

Published online by Cambridge University Press:  20 May 2016

R. Van Grieken ,
Z. Spolnik ,
K. Van Meel  and
S. Potgieter-Vermaak
R. Van Grieken
Affiliation:
University of Antwerp, Antwerp, Belgium
Z. Spolnik
Affiliation:
University of Antwerp, Antwerp, Belgium
K. Van Meel
Affiliation:
University of Antwerp, Antwerp, Belgium
S. Potgieter-Vermaak
Affiliation:
University of Antwerp, Antwerp, Belgium
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Abstract

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Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 20 , Issue 2 , June 2005 , pp. 175
Copyright
Copyright © Cambridge University Press 2005

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