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Comparison methods of variance and line profile analysis for the evaluation of microstructures of materials

Published online by Cambridge University Press:  29 February 2012

V. Soleimanian  and
S. R. Aghdaee
V. Soleimanian
Affiliation:
Department of Physics, Iran University of Science and Technology, Narmak, 16844 Teheran, Iran
S. R. Aghdaee*
Affiliation:
Department of Physics, Iran University of Science and Technology, Narmak, 16844 Teheran, Iran
*
a)Author to whom correspondence should be addressed. Electronic mail: aghdaee@iust.ac.ir
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Abstract

A comparison of different methods of X-ray diffraction analysis for the determination of crystallite size and microstrain; namely, line profile analysis, Rietveld refinement, and three approaches based on the variance method, is presented. The analyses have been applied to data collected on a ceria sample prepared by the IUCr Commission on Powder Diffraction. In the variance method, split Pearson VII, the Voigt function, and its approximation pseudo-Voigt function were fitted to X-ray diffraction line profiles. Based on the fitting results, the variances of line profiles were calculated and then the crystallite size and root mean square strain were obtained from variance coefficients. A SS plot of Langford as well as a Fourier analysis and Rietveld refinement have been carried out. The average crystallite size and microstrain were determined. The values of area-weighted domain size determined from the variance method are in agreement with those obtained from line profile analysis within a single (largest) standard uncertainty, and the volume-weighted domain sizes derived from the SS plot, Fourier size distribution, and Rietveld refinement agree within a single standard uncertainty. The results of rms strain calculated from variance and Pearson VII shape function and those from Rietveld refinements fall within a single esd. However, the variance method in conjunction with pseudo-Voigt and Voigt functions produce rms strains substantially larger than those determined from line profile analysis and Rietveld refinements.

Keywords

line broadeningX-ray diffraction (XRD)microstructure
Type
Technical Articles
Information
Powder Diffraction , Volume 23 , Issue 1 , March 2008 , pp. 41 - 51
Copyright
Copyright © Cambridge University Press 2008

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