Most cited
This page lists all time most cited articles for this title. Please use the publication date filters on the left if you would like to restrict this list to recently published content, for example to articles published in the last three years. The number of times each article was cited is displayed to the right of its title and can be clicked to access a list of all titles this article has been cited by.
- Cited by 2
Pioneers in Optics: Alexandre Edmond Becquerel and William Henry Bragg
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- Published online by Cambridge University Press:
- 08 July 2011, pp. 42-44
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- Cited by 2
The Undesirable Effects and Impacts of Ice Contamination Experienced in the Cryo-Electron Tomography Workflow and Available Solutions
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- Published online by Cambridge University Press:
- 31 May 2022, pp. 30-35
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- Cited by 2
Electrical and Mechanical Characterization of Li Ion Battery Electrode using PinPoint™ SSRM
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- Published online by Cambridge University Press:
- 18 May 2020, pp. 48-53
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- Cited by 2
PNDetector
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- Published online by Cambridge University Press:
- 18 March 2021, p. 22
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- Cited by 2
A Novel Gemini® STEM Detector System
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- Published online by Cambridge University Press:
- 14 March 2018, pp. 18-21
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- Cited by 2
Light Microscopy Analysis of Bone Response to Implant Surfaces
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- Published online by Cambridge University Press:
- 17 June 2016, pp. 28-33
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- Cited by 2
Preparing Monochromatic Images for Publication: Theoretical Considerations and Practical Implications
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- Published online by Cambridge University Press:
- 21 January 2014, pp. 18-25
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- Cited by 2
A Leeuwenhoek-Type Mobile Microscope for Histology Education
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- Published online by Cambridge University Press:
- 23 July 2020, pp. 54-59
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- Cited by 2
How to Promote a Facility in Order to Increase Use, Acquire New Equipment and, as a Result, Increase Revenue
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- 14 March 2018, pp. 32-37
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- Cited by 2
Recent Advances in High-Speed Orientation Mapping
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- Published online by Cambridge University Press:
- 14 March 2018, pp. 6-9
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- Cited by 2
SmarAct Inc.
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- Published online by Cambridge University Press:
- 18 March 2021, p. 23
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- Cited by 2
Dual-Lens Electron Holography for Junction Profiling and Strain Mapping of Semiconductor Devices
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- Published online by Cambridge University Press:
- 13 May 2014, pp. 28-35
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- Cited by 2
Moore's Law: A Review of Feature Size Shrinkage and its Effect on Microscopy in the Semiconductor Industry
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- 14 March 2018, pp. 6-11
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- Cited by 2
Industry News
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- Published online by Cambridge University Press:
- 14 March 2018, p. 35
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- Cited by 2
Pioneers in Optics: Dominique-François-Jean Arago and Augustin-Jean Fresnel
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- Published online by Cambridge University Press:
- 28 January 2010, pp. 46-47
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A New Perspective on Mechanical Testing: In Situ Compression in the TEM
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- 14 March 2018, pp. 34-37
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- Cited by 2
Resolution and Sampling in Digital Imaging
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- Published online by Cambridge University Press:
- 14 March 2018, pp. 24-29
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- Cited by 2
As Clear as a Cell: Researchers See Deeper into Tissue than Ever Before
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- Published online by Cambridge University Press:
- 19 July 2013, pp. 10-13
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Using the Virtual Cell Simulation Environment for Extracting Quantitative Parameters from Live Cell Fluorescence Imaging Data
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- Published online by Cambridge University Press:
- 01 December 2009, pp. 36-39
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- Cited by 2
Principal Components Analysis of Multispectral Image Data
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- 14 March 2018, pp. 36-39
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