Microscopy and Microanalysis: Volume 26 -

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

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Microscopy and Microanalysis

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Volume 26 - December 2020

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

Metastable fcc Structure of Ti-Mg Alloy Synthesized by Mechanical Alloying

Strengthening of an Al 7075 Alloy with Graphene Synthetized by an Environmental Friendly Method

Study of the DO3 Superlatice Structure of The Fe74.3Si14.2Cu1Nb3B7.5 Alloy

Microstructural Behavior of the Intermetallic Compound CaMgSi Synthesized by Mechanical Milling and Spark Plasma Sintering

Aluminium Matrix Composites (AA6061/CaSiO3) Obtained by Powder Metallurgy

Wear Behavior of Graphene-Platelet/Al7075 Composites Produced by Mechanical Alloying

High-entropy Alloys Fabricated Through Powder Metallurgy for Low-temperature Applications

The Effect of Beam Scan Strategies on the Microstructure of EBM Additively Manufactured Inconel 738

Multi-Material Binder Jet Printing of Functional Ni-Mn-Ga Alloys

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Streamlining Processing and Utilization of EM Data - An Efficient Open-source Solution

NexusLIMS: Leveraging Shared Microscopy Resources for Data Analysis with a Configurable Laboratory Information Management System

A Python Based Open-source Multislice Simulation Package for Transmission Electron Microscopy

A Universal Scripting Engine for Transmission Electron Microscopy

STEMTooL: An Open Source Python Toolkit for Analyzing Electron Microscopy Datasets

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Retaining Precision at Low-dose and High-speed STEM Imaging Conditions

Atomic and Electronic Structure Evolution of ZIF-L Metal Organic Framework During Amorphization

Atomic-scale Imaging of Atomically-thin Organic Crystals via Low-dose STEM

High-resolution Analytical STEM of Defects and Interfaces in Beam-sensitive Ultra-thin Cuprate Films

Electron Beam Aberration Correction Using Optical Fields

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Complimentary Microwave Interrogation in Surface Analysis

Investigation of Vortex Pinning in Ni Doped BaFe2As2 Superconductor with Machine-learning

Microscopy and Microanalysis

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Volume 26 - December 2020

Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems

Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems

Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX

Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Complimentary Microwave Interrogation in Surface Analysis