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High-resolution Analytical STEM of Defects and Interfaces in Beam-sensitive Ultra-thin Cuprate Films

Published online by Cambridge University Press:  30 July 2020

Vesna Srot ,
Yi Wang ,
Matteo Minola ,
Ute Salzberger ,
Marco Salluzzo ,
Gabriella Maria De Luca ,
Bernhard Keimer  and
Peter van Aken
Vesna Srot
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany
Yi Wang
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany
Matteo Minola
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany
Ute Salzberger
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany
Marco Salluzzo
Affiliation:
CNR-SPIN, Napoli, Campania, Italy
Gabriella Maria De Luca
Affiliation:
Dipartimento di Fisica ``E. Pancini``, Napoli, Campania, Italy
Bernhard Keimer
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany
Peter van Aken
Affiliation:
Max Planck Institute for Solid State Research, Stuttgart, Baden-Wurttemberg, Germany

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2972 - 2973
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Copyright
Copyright © Microscopy Society of America 2020

References

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Srot, V et al. , Microsc Microanal 25 (Suppl 2) (2019) 686.10.1017/S1431927619004161CrossRefGoogle Scholar
Wang, Y et al. , Ultramicroscopy 168 (2016) 46.10.1016/j.ultramic.2016.06.001CrossRefGoogle Scholar
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This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No. 823717 – ESTEEM3.Google Scholar